Application of Auger Spectroscopy for Measurement of Secondary Electron Emission from Conducting Materials for Electric Propulsion Devices

TitleApplication of Auger Spectroscopy for Measurement of Secondary Electron Emission from Conducting Materials for Electric Propulsion Devices
Publication TypeConference Paper
Year of Publication2013
AuthorsPatino, Marlene I., Yevgeny Raitses, Bruce E. Koel, and Richard E. Wirz
Conference Name33rd International Electric Propulsion Conference
Conference LocationGeorge Washington University, Washington D.C, USA
Call NumberIEPC-2013-320
AbstractA facility utilizing Auger electron spectroscopy was developed to measure secondary electron emission from conducting materials. Both the total secondary electron emission yield and the energy distribution of the emitted electrons were measured for graphite for primary electron beam energies of 50 to 500eV. The total yield calculated using two different techniques – with the secondary electron emission calculated from current measurements of the sample and from a hemispherical collector - were found to agree well with each other and with a semi-empirical equation for the energies at which the measurements were taken.

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